Product Center
Product Center
YMS
Yield Management System
Product Overview
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Engineering data analysis (EDA) system for factory managementHelp users to more accurately solve problems in data analysis, with more professional models and a higher and more comprehensive perspective. -
Use statistical methods and models for integrationTrajectory of the data of operation processes, including production, equipment management, factory management, quality control and etc. in semiconductor factories -
Years of experience of implementation for clientsThe implementation of adding new system features and enhancement modules
Intelligent tools and rich application scenarios
Features
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01—Module 1—
Data management and BI modules
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02—Module II—
Standard statistical models and chart templates
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03—Module III—
Data integration management and analysis based on business layers
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04—Module IV—
Customized analysis model templates, integrated with FDC and ADC systems
Advantage Effect
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Customized templates for yield tendency of the whole plant in panel industry
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CP (chip probing) yield of semiconductor and Defect Map Overlay management
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CP yield of semiconductor and Defect Map Overlay management
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